SCANNING ELECTRON MICROSCOPY WINDOW FOR NANO WORLD BY ANALYTICAL TECHNOLOGIES LIMITED DEMONSTRATION

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Analytical Technologies Limited

● High Quality Images (5nm resolution) ● Magnification Up To 150,000x ● Easy Navigation with the "Navigation Mode" ● Precise Control with a Joystick and the "Driving Mode" ● Combined SE and BSE Images ● Low Energy Consumption ● Intuitive User Interface Tru-Q Analysis Engine: Accurate Result By Multi Algorithm. Multilingual Operation. Fast & Easy Analysis With Functions: Point & ID, Line Scan, Mapping, Line Overlap & Backgrund Correction. Quantitative Mapping (QuanLineScan, QuantMap). Highest Performance SDD. Sensor Size : 300mm2. High quility Light Element Analysis: Be(4)~Am(95). Diverse Element Analysis Functions: Point&ID Line Scan, Mapping. Magnificatiion UpTO x 100,000 Auto Stage: X,Y,T Axis Click & Mive Stage Control Auto Function: Filament Memory, Focus, Contrast, Brightness High Definition Image: 5120 x 3840 Pixel Accurate & Fast Data Process High Resolution: 133eV at Mn, B(5)~U(92) Peltier Cooling (LN2 & Water & Fan Free) Ourstanding Quantitative, Qualitative Analysis Magnification Up To 300,000x Full Auto Stage (X,Y,R,T,Z Axis) Panorama Shot Click &Move Stage Control Auto Functions : Filament, Focus, Contrast, Brightness HIgher Image Pixel : 5120 x 3840 Pixel