Thin Film Measurements With Nanotech Security Corporation



July 29, 2014

Nanotech Security Corp. uses the Photon Control SPM-002-DH for transmission, reflection, and refraction measurements of their patented thin film samples. Featured Products: SPM-002-DH (200-850 nm) SPL-2H Tungsten Halogen Light Source OEM sample holder Learn more about Nanotech Security Corp.: Learn more about Photon Control Inc.


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