Tour of the Hiden SIMS Workstation, a UHV Surface Analysis System for Thin Film Depth Profiling



September 22, 2016

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  • The Hiden SIMS Workstation is a stand-alone, general purpose, UHV SIMS/SNMS analysis system based around the MAXIM analyser. The instrument is both powerful and easy to use with a self-tuning secondary ion column and software controlled ion guns.

    - Rapid turnaround of all types of samples
    - Static and dynamic SIMS
    - Integral ioniser for SNMS and RGA
    - Choice of Ion guns
    - SNMS surface mapping / imaging
    - Surface contamination analysis
    - Quantification of matrix level by SNMS
    - Flexible and upgradeable configuration
    - Low cost of ownership

    DiagnosticsFood and BeverageForensic ScienceMass Spectrometry

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