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EDX-7000/8000 Energy Dispersive X-ray Fluorescence Spectrometers

from Shimadzu Analytical & Measuring

Incorporating a new state-of-the-art, high-performance semiconductor detector (SDD), the EDX-7000/8000 spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research. The SDD offers a high fluorescent X-ray count per unit time. This enables precise, high-resolution analysis while increasing throughput. In addition, since it is electronically cooled, the SDD does not require liquid nitrogen, thereby reducing operating costs and maintenance requirements. The systems offer measurement ranges of 11Na to 92U (EDX-7000) and 6C to 92U (EDX-8000) while five primary filters enable highly sensitive analysis of trace elements. They also feature a sample observation camera, large sample chamber, and easy-to-use control, analysis, and reporting software. A variety of optional equipment, including a vacuum measurement unit, helium purge unit, and screening analysis kit, is also available.

about 4 years ago

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